示例機型：

DSI-N-ALCOW（COW） / DSI-N-ALCOT（COT）

應用領域Application:

應用于LED晶圓生產領域。設備主要用于對裂片前后的晶粒進行外觀缺陷檢測。采用先進的組合光源打光技術和高速高分辨率相機，可以清楚的識別晶粒的外觀瑕疵以及晶粒排列。

It is applied in the field of LED wafer production. The equipment is used to detect the appearance defects of the grains before and after the crack. By using advanced combined light and using the high-speed and high-resolution camera, the appearance defects and grain arrangement can be clearly identified.

主要特點Main Features:

● 高速檢測，檢測效果行業領先；

High speed detection with industry-leading detect effect；

● 數據化，產品信息記錄上傳，有助于生產管控；

Data recording and uploading. Product data upload is is conducive to production control;

● 特制組合光源，保證檢測效果與穩定；

Special custom combined light ensures the detection effect and stability；

● 全自動兼容4寸、6寸片生產.

Automatic production, compatible with 4 & 6 inch wafer.

主要參數 Main Parameters:

實例效果 Sample Effect: